skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: The single event upset response of the analog devices, ADSP2100A, digital signal processor

Abstract

This paper presents the results of a radiation evaluation program carried out by ESTEC on the Analog Devices, ADSP2100A, which is a single chip microprocessor optimized for 12.5 Mips Digital Signal Processing (DSP). Single Event Upset/Latch-up (SEU/SEL) testing using Californium-252 was the primary aim of this program, however, accelerator heavy ion and proton SEU/SEL data as well as total ionizing dose data are also presented. The hardware design and software used will be described and details of the various tests and test facilities will be given. Finally, the authors report on the use of the SEU data for the calculation of expected in-orbit upset rates using the CREME suite of programs.

Authors:
; ; ;  [1]
  1. (European Space Agency/ESTEC, Noordwijk (NL))
Publication Date:
OSTI Identifier:
7108284
Resource Type:
Journal Article
Resource Relation:
Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States); Journal Volume: 39:3
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; ANALOG SYSTEMS; RADIATION EFFECTS; MICROPROCESSORS; COMPUTER CODES; DESIGN; DIGITAL SYSTEMS; EPITAXY; HEAVY IONS; LAYERS; MICROELECTRONICS; OPTIMIZATION; PROTONS; RESPONSE FUNCTIONS; TESTING; BARYONS; CHARGED PARTICLES; COMPUTERS; ELECTRONIC CIRCUITS; ELEMENTARY PARTICLES; FERMIONS; FUNCTIONS; HADRONS; IONS; MICROELECTRONIC CIRCUITS; NUCLEONS; 440200* - Radiation Effects on Instrument Components, Instruments, or Electronic Systems; 990200 - Mathematics & Computers

Citation Formats

Harboe-Sorensen, R., Seran, H., Armbruster, P., and Adams, L. The single event upset response of the analog devices, ADSP2100A, digital signal processor. United States: N. p., 1992. Web. doi:10.1109/23.277534.
Harboe-Sorensen, R., Seran, H., Armbruster, P., & Adams, L. The single event upset response of the analog devices, ADSP2100A, digital signal processor. United States. doi:10.1109/23.277534.
Harboe-Sorensen, R., Seran, H., Armbruster, P., and Adams, L. 1992. "The single event upset response of the analog devices, ADSP2100A, digital signal processor". United States. doi:10.1109/23.277534.
@article{osti_7108284,
title = {The single event upset response of the analog devices, ADSP2100A, digital signal processor},
author = {Harboe-Sorensen, R. and Seran, H. and Armbruster, P. and Adams, L.},
abstractNote = {This paper presents the results of a radiation evaluation program carried out by ESTEC on the Analog Devices, ADSP2100A, which is a single chip microprocessor optimized for 12.5 Mips Digital Signal Processing (DSP). Single Event Upset/Latch-up (SEU/SEL) testing using Californium-252 was the primary aim of this program, however, accelerator heavy ion and proton SEU/SEL data as well as total ionizing dose data are also presented. The hardware design and software used will be described and details of the various tests and test facilities will be given. Finally, the authors report on the use of the SEU data for the calculation of expected in-orbit upset rates using the CREME suite of programs.},
doi = {10.1109/23.277534},
journal = {IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)},
number = ,
volume = 39:3,
place = {United States},
year = 1992,
month = 6
}
  • A double-washer dc superconducting quantum interference device (SQUID) gradiometer with a flux-locked loop (FLL) based on a digital signal processor (DSP) has been developed for biomagnetic applications. All of the analog electronics in the conventional FLL are replaced and implemented by the DSP except for the low-noise field-effect transistor preamplifier at the front end of the signal recovery components. The DSP performs the signal demodulation by synchronously sampling the recovered signals and applying the appropriate full wave rectification. The signals are then integrated, filtered, and applied to the output. At 4.2 K, the white flux noise of the gradiometer measuredmore » in a DSP FLL mode is about 4{mu}{phi}{sub 0}/{radical}Hz and the noise at 1 Hz is 13 {mu}{phi}{sub 0}/{radical}Hz. The corresponding noise levels in the gradiometer operated by the conventional FLL are 1.8 and 3{mu}{phi}{sub 0}/{radical}Hz. The poorer system performance in the DSP FLL compared to the analog FLL is mainly caused by the ambient field noise and interference signals picked up through the connecting cables. Additional noise is also added to the overall noise floor by the instruments employed in the DSP system in the present prototype setup. Further improvement in the noise characteristics and the dynamic behavior of the DSP SQUID gradiometer is expected when a better configuration of DSP with the associated I/O devices is implemented. Additional improvements of the DSP programs are expected by incorporating higher-order integration, adaptive control, and noise reduction schemes. {copyright} {ital 1996 American Institute of Physics.}« less
  • This paper describes a processor designed for event sampling according to the difference in the numbers of particles passing through two hodoscope planes with 64 and 128 inputs. The signal delay of the process is less than 55 nsec. Data compression is employed to increase economy and speed. Parallel compressors can be implemented by digital as well as analog integrated circuits. A block diagram of the analog-digital processor is shown. The circuit is implemented in the CAMAC standard and occupies a unit of width 3M. To eliminate temperature drift of the logic signals, temperature regulation of the reference voltage ismore » used at the summation point in the analog-digital processor.« less
  • NANA implements some fast and simple processing algorithms, for use in future High Energy Physics (HEP) experiments. After the first level trigger, the data rate is sufficiently small to allow channel merging and some processing with dedicated hardware. For detectors whose signal is companded prior to digitization, the data samples need to be expanded to the original dynamic range, as further physics analysis usually deals with linear values. A 16 bit integer piece-wise polynomial approximation of the expansion function recovers the original dynamic range, without introducing significant degradation on the detector`s intrinsic resolution. A 16bit integer multiplier and adder-accumulator ismore » accurate enough for time information extraction and for determination of the energy deposited in one channel. The time resolution is sufficient to correctly identify the bunch crossing that corresponds to a particular pulse. The energy accuracy is limited only by the detector`s resolution. The extracted features carry all the information subsequently needed. The whole set of samples of a pulse can thus be replaced by a few data words. Initially aimed at the calorimetry front-end, the algorithms may be applied to any similar sampled detector signal.« less
  • A heavy ion beam diagnostic system installed at the Brookhaven Single Event Upset Test Facility is described. Calibration of the system with the help of {alpha}-particles, essential for linear energy transfer (LET) measurements, is discussed. Measured LET values for 20 different ions, including {sup 7}Li, {sup 9}B, {sup 12}C, {sup 16}O, {sup 19}F, {sup 28}Si, {sup 32}S, {sup 35}Cl, {sup 40}Ca, {sup 45}Sc, {sup 48}Ti, {sup 56}Fe, {sup 58}Ni, {sup 63}Cu, {sup 74}Ge, {sup 79}Br, {sup 107}Ag, {sup 127}I, {sup 197}Au, and {sup 235}U, with energies between 0.5 and 8.5 MeV/AMU but not exceeding 400 MeV for the heaviest ions,more » are presented in both graphical and numerical forms. Results are compared to predictions of the TRIM-90 simulation program, with an average difference between the measured and calculated values of 2 {+-} 6%.« less
  • The characteristics Of ion-induced charge collection and single-event upset are studied in SOI transistors and circuits with various body tie structures. Impact ionization effects including single-event snapback are shown to be very important. Focused ion microbeam experiments are used to find single-event snapback drain voltage thresholds in n-channel SOI transistors as a function of device width. Three-Dimensional device simulations are used to determine single-event upset and snapback thresholds in SOI SRAMS, and to study design tradeoffs for various body-tie structures. A window of vulnerability to single-event snapback is shown to exist below the single-event upset threshold. The presence of single-eventmore » snapback in commercial SOI SRAMS is confirmed through broadbeam ion testing, and implications for hardness assurance testing of SOI integrated circuits are discussed.« less