The single event upset response of the analog devices, ADSP2100A, digital signal processor

Journal Article · Mon Jun 01 00:00:00 EDT 1992 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.277534· OSTI ID:7108284

Harboe-Sorensen, R; Seran, H; Armbruster, P; Adams, L ^[1]

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1. European Space Agency/ESTEC, Noordwijk (NL)

This paper presents the results of a radiation evaluation program carried out by ESTEC on the Analog Devices, ADSP2100A, which is a single chip microprocessor optimized for 12.5 Mips Digital Signal Processing (DSP). Single Event Upset/Latch-up (SEU/SEL) testing using Californium-252 was the primary aim of this program, however, accelerator heavy ion and proton SEU/SEL data as well as total ionizing dose data are also presented. The hardware design and software used will be described and details of the various tests and test facilities will be given. Finally, the authors report on the use of the SEU data for the calculation of expected in-orbit upset rates using the CREME suite of programs.

• OSTI ID: 7108284
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 39:3; ISSN 0018-9499; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
ANALOG SYSTEMS
BARYONS
CHARGED PARTICLES
COMPUTER CODES
COMPUTERS
DESIGN
DIGITAL SYSTEMS
ELECTRONIC CIRCUITS
ELEMENTARY PARTICLES
EPITAXY
FERMIONS
FUNCTIONS
HADRONS
HEAVY IONS
IONS
LAYERS
MICROELECTRONIC CIRCUITS
MICROELECTRONICS
MICROPROCESSORS
NUCLEONS
OPTIMIZATION
PROTONS
RADIATION EFFECTS
RESPONSE FUNCTIONS
TESTING