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Title: The single event upset response of the analog devices, ADSP2100A, digital signal processor

Abstract

This paper presents the results of a radiation evaluation program carried out by ESTEC on the Analog Devices, ADSP2100A, which is a single chip microprocessor optimized for 12.5 Mips Digital Signal Processing (DSP). Single Event Upset/Latch-up (SEU/SEL) testing using Californium-252 was the primary aim of this program, however, accelerator heavy ion and proton SEU/SEL data as well as total ionizing dose data are also presented. The hardware design and software used will be described and details of the various tests and test facilities will be given. Finally, the authors report on the use of the SEU data for the calculation of expected in-orbit upset rates using the CREME suite of programs.

Authors:
; ; ;  [1]
  1. (European Space Agency/ESTEC, Noordwijk (NL))
Publication Date:
OSTI Identifier:
7108284
Resource Type:
Journal Article
Resource Relation:
Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States); Journal Volume: 39:3
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; ANALOG SYSTEMS; RADIATION EFFECTS; MICROPROCESSORS; COMPUTER CODES; DESIGN; DIGITAL SYSTEMS; EPITAXY; HEAVY IONS; LAYERS; MICROELECTRONICS; OPTIMIZATION; PROTONS; RESPONSE FUNCTIONS; TESTING; BARYONS; CHARGED PARTICLES; COMPUTERS; ELECTRONIC CIRCUITS; ELEMENTARY PARTICLES; FERMIONS; FUNCTIONS; HADRONS; IONS; MICROELECTRONIC CIRCUITS; NUCLEONS; 440200* - Radiation Effects on Instrument Components, Instruments, or Electronic Systems; 990200 - Mathematics & Computers

Citation Formats

Harboe-Sorensen, R., Seran, H., Armbruster, P., and Adams, L.. The single event upset response of the analog devices, ADSP2100A, digital signal processor. United States: N. p., 1992. Web. doi:10.1109/23.277534.
Harboe-Sorensen, R., Seran, H., Armbruster, P., & Adams, L.. The single event upset response of the analog devices, ADSP2100A, digital signal processor. United States. doi:10.1109/23.277534.
Harboe-Sorensen, R., Seran, H., Armbruster, P., and Adams, L.. Mon . "The single event upset response of the analog devices, ADSP2100A, digital signal processor". United States. doi:10.1109/23.277534.
@article{osti_7108284,
title = {The single event upset response of the analog devices, ADSP2100A, digital signal processor},
author = {Harboe-Sorensen, R. and Seran, H. and Armbruster, P. and Adams, L.},
abstractNote = {This paper presents the results of a radiation evaluation program carried out by ESTEC on the Analog Devices, ADSP2100A, which is a single chip microprocessor optimized for 12.5 Mips Digital Signal Processing (DSP). Single Event Upset/Latch-up (SEU/SEL) testing using Californium-252 was the primary aim of this program, however, accelerator heavy ion and proton SEU/SEL data as well as total ionizing dose data are also presented. The hardware design and software used will be described and details of the various tests and test facilities will be given. Finally, the authors report on the use of the SEU data for the calculation of expected in-orbit upset rates using the CREME suite of programs.},
doi = {10.1109/23.277534},
journal = {IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)},
number = ,
volume = 39:3,
place = {United States},
year = {Mon Jun 01 00:00:00 EDT 1992},
month = {Mon Jun 01 00:00:00 EDT 1992}
}