Observation of single event upsets in analog microcircuits

Conference · Tue Nov 30 23:00:00 EST 1993 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:7125353

Koga, R; Pinkerton, S D; Moss, S C; Mayer, D C; LaLumondiere, S; Hansel, S J; Crawford, K B; Crain, W R ^[1]

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1. Aerospace Corp., Los Angeles, CA (United States)

Selected analog devices were tested for heavy ion induced single event upset (SEU). The results Of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptible to SEU in the laboratory, has also experienced upset in space. Possible strategies for mitigating the occurrence of analog SEUs in space are discussed.

• OSTI ID: 7125353
• Report Number(s): CONF-930704--
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 40:6Pt1; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANALOG SYSTEMS
DATA
ELECTRONIC CIRCUITS
EXPERIMENTAL DATA
INFORMATION
IONIZING RADIATIONS
MICROELECTRONIC CIRCUITS
MITIGATION
NUMERICAL DATA
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATIONS
SPACE FLIGHT