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Trends in parts susceptibility to single event upset from heavy ions

Technical Report ·
OSTI ID:6864754
; ; ; ; ; ;

New test data from the Jet Propulsion Laboratory (JPL), The Aerospace Corporation, Rockwell International (ANAHEIM) and IRT have been combined with published data of JPL and Aerospace to form a nearly comprehensive body of single event upset (SEU) test data for heavy ion irradiations. This data has been arranged to exhibit the SEU susceptibility of devices by function, technology and manufacturer. Clear trends emerge which should be useful in predicting future device performance.

Research Organization:
Jet Propulsion Lab., Pasadena, CA (USA)
OSTI ID:
6864754
Report Number(s):
ATR-6(8139)-1
Country of Publication:
United States
Language:
English

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Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLES
COMPUTERIZED SIMULATION
DATA ANALYSIS
HEAVY IONS
IONS
MEASURING INSTRUMENTS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
SIMULATION
TIME DEPENDENCE