Update on parts SEE susceptibility from heavy ions

Conference · Sat Nov 30 23:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:5825868

Nichols, D K; Smith, L S; Schwartz, H R; Soli, G; Watson, K ^[1]; Koga, R; Crain, W R; Crawford, K B; Hansel, S J; Lau, D D ^[2]

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1. Jet Propulsion Lab., Pasadena, CA (United States)
2. Space Sciences Lab., Aerospace Corp., El Segundo, CA (US)

Jet Propulsion Laboratory (JPL) and the The Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data. In this paper trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are displayed.

• OSTI ID: 5825868
• Report Number(s): CONF-910751--
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 38:6; ISSN 0018-9499; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

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Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
661320 -- Auroral
Ionospheric
& Magnetospheric Phenomena-- (1992-)
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CHARGED PARTICLES
DATA
HEAVY IONS
INFORMATION
IONS
RADIATION EFFECTS
TESTING