Overview of device SEE susceptibility from heavy ions. Technical report
Technical Report
·
OSTI ID:635976
A fifth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications (1,2,3,4) in December issues for 1985, 1987, 1989, and 1991. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are evaluated.
- Research Organization:
- Aerospace Corp., Technology Operations, El Segundo, CA (United States)
- OSTI ID:
- 635976
- Report Number(s):
- AD-A--345739/7/XAB; TR--93(3940)-4
- Country of Publication:
- United States
- Language:
- English
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