Single-event effects in resolver-to-digital converters

Journal Article · Tue Nov 30 23:00:00 EST 1999 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers)

DOI:https://doi.org/10.1109/23.819106· OSTI ID:20014698

Buchner, S; Tran, L; Mann, J; Turflinger, T; McMorrow, D; Campbell, A; Dozier, C

Single-event effects (SEE's) in two resolver-to-digital converters (RDC's) have been studied using heavy ions and pulsed laser light. The important role of the pulsed laser in establishing single-event upset (SEU) and single-event latchup (SEL) levels prior to accelerator testing is described, as is its role in evaluating the test software and hardware and in gaining a better understanding of the origins of the SEE's. Results from pulsed-laser testing are in quantitative agreement with those from heavy-ion testing: the RDC-19220 is sensitive to both SEU's and SEL's whereas the AD2S80 is less sensitive to SEU's and immune to SEL.

• Research Organization: NRL, Washington, DC (US)
• OSTI ID: 20014698
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers) Journal Issue: 6Pt1 Vol. 46; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
ANALOG-TO-DIGITAL CONVERTERS
FAILURES
HEAVY IONS
INTEGRATED CIRCUITS
LASER RADIATION
PHYSICAL RADIATION EFFECTS
TESTING