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Soft x-ray photoemission investigation on the effect of In doping in CdS/CuInSe sub 2 heterojunction formation

Journal Article · · Journal of Applied Physics; (United States)
DOI:https://doi.org/10.1063/1.351895· OSTI ID:7048652
;  [1]; ; ;  [2]
  1. National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden, Colorado 80401 (United States)
  2. Synchrotron Radiation Center, University of Wisconsin-Madison, 3731 Schneider Drive, Stoughton, Wisconsin 53589 (United States)

Synchrotron radiation soft x-ray photoemission spectroscopy was used to investigate the development of the electronic structure at the CdS(In)/CuInSe{sub 2} heterojunction interface. In-doped CdS overlayers were deposited in steps on single-crystal {ital n}-type CuInSe{sub 2} at 250 {degree}C. Results indicate that the CdS(In) grows in registry with the substrate, initially in a two-dimensional growth mode followed by three-dimensional island growth as is corroborated by reflection high-energy electron diffraction analysis. Photoemission measurements were acquired after each growth in order to observe changes in the valence-band electronic structure. The results were used to correlate the interface chemistry with the electronic structure at these interfaces and to directly determine the CdS(In)/CuInSe{sub 2} heterojunction valence-band discontinuity and the consequent heterojunction band diagram as a function of In dopant concentration. We measured a valence-band offset {Delta}{ital E}{sub {ital v}}=0.3 eV, independent of In doping.

DOE Contract Number:
AC02-83CH10093
OSTI ID:
7048652
Journal Information:
Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 72:12; ISSN 0021-8979; ISSN JAPIA
Country of Publication:
United States
Language:
English