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Synchrotron-radiation photoemission study of CdS/CuInSe sub 2 heterojunction formation

Journal Article · · Physical Review, B: Condensed Matter; (USA)
;  [1];  [2];  [3]; ;  [4]
  1. Solar Energy Research Institute, 1617 Cole Boulevard, Golden, CO (USA)
  2. Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL (USA)
  3. Department of Physics, University of Calabria, I-87036 Arcavacata di Rende, Cosenza (Italy)
  4. Synchrotron Radiation Center, University of Wisconsin-Madison, Stoughton, WI (USA)

Synchrotron-radiation soft-x-ray photoemission spectroscopy was used to investigate the development of the electronic structure at the CdS/CuInSe{sub 2} heterojunction interface. CdS overlayers were deposited in steps on single-crystal {ital p}- and {ital n}-type CuInSe{sub 2} at 250 {degree}C. Results indicate that the CdS grows in registry with the substrate, initially in a two-dimensional growth mode followed by three-dimensional island growth as is corroborated by reflection high-energy electron-diffraction analysis. Photoemission measurements were acquired after each growth in order to observe changes in the valence-band electronic structure as well as changes in the In 4{ital d}, Se 3{ital d}, Cd 4{ital d}, and S 2{ital p} core lines. The results were used to correlate the interface chemistry with the electronic structure at these interfaces and to directly determine the CdS/CuInSe{sub 2} heterojunction valence-band discontinuity and the consequent heterojunction band diagram. These results show that the Katnani-Margaritondo method is unreliable in determining offsets for heterojunctions where significant Fermi-level pinning may occur and where the local structure and chemistry of the interface depends strongly on the specific heterojunction.

DOE Contract Number:
AC02-83CH10093
OSTI ID:
6288284
Journal Information:
Physical Review, B: Condensed Matter; (USA), Journal Name: Physical Review, B: Condensed Matter; (USA) Vol. 42:12; ISSN PRBMD; ISSN 0163-1829
Country of Publication:
United States
Language:
English