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Nuclear monochromator by grazing incidence anti-reflection films of sup 119 SnO sub 2

Conference ·
OSTI ID:7015921
;  [1]; ; ; ;  [2]
  1. City Coll., New York, NY (United States). Dept. of Physics
  2. Argonne National Lab., IL (United States)
A nuclear monochromator using grazing incidence anti-reflection (GIAR) films of {sup 119}SnO{sub 2} coated on a Pd backing mirror was designed, fabricated and characterized. {sup 119}SnO{sub 2} /Pd/quartz GIAR films were synthesized by a magnetron reactive sputtering technique. The films were characterized by x-ray scattering of 23.87 keV synchrotron radiation source. From the measurement of off-resonance reflectivity and the simulation of the resonant nuclear reflectivity, {approximately} 0.8 reflectivity with 10{sup {minus}2} electronic reflectivity and an energy band width {approximately} 100{Gamma} where {Gamma} is a natural line width, at a 2 mrad incident beam angle would be expected. The requirements and alternative methods to improve performance of a GIAR film nuclear monochromator were discussed.
Research Organization:
Argonne National Lab., IL (United States)
Sponsoring Organization:
DOE; USDOE, Washington, DC (United States)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
7015921
Report Number(s):
ANL/CP-76823; CONF-920708--2; ON: DE92040731
Country of Publication:
United States
Language:
English