SnO sub 2 grazing-incidence antireflection films for monochromatization of synchrotron radiation: Design, preparation, and characterization

Journal Article · Tue Dec 15 04:00:00 EST 1992 · Journal of Applied Physics; (United States)

DOI:https://doi.org/10.1063/1.351916· OSTI ID:6958438

Homma, H; Kentjana, M ^[1]; Alp, E E; Mooney, T M; Witthoff, E; Toellner, T ^[2]

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1. Department of Physics, Brooklyn College of the City University of New York, Brooklyn, New York 11210 (United States)
2. Advanced Photon Source Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

Grazing-incidence antireflection (GIAR) films are used to suppress electronic reflectivity, while maintaining good nuclear resonant reflectivity to help monochromatize the synchrotron radiation down to the {mu}eV level of energy resolution. Such monochromators will have superior throughput by a factor of 100--500 compared to natural linewidth of individual nuclei. {sup 119}SnO{sub 2} GIAR films of various thicknesses were designed and fabricated on Pd-coated quartz substrates. The performance of these films was evaluated based on the measurement of off-resonance x-ray reflectivity using Mo{ital K}{alpha} radiation and conversion electron Moessbauer spectroscopy. A Pd film was deposited on a quartz substrate at room temperature and was subsequently annealed at 500 {degree}C in an Ar atmosphere at a substrate temperature of 200 {degree}C, SnO{sub 2} was sputtered onto the Pd by reactive sputtering in an Ar and O{sub 2} atmosphere. Employing quantitative analysis of surface and interface roughness, a series of experiments was also conducted to determine optimal sputtering conditions.

• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 6958438
• Journal Information: Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 72:12; ISSN 0021-8979; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
440600 -- Optical Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
ANTIREFLECTION COATINGS
BREMSSTRAHLUNG
CHALCOGENIDES
COATINGS
DESIGN
ELECTROMAGNETIC RADIATION
ELEMENTS
FABRICATION
GAMMA SPECTROMETERS
INTERFACES
MEASURING INSTRUMENTS
METALS
MOESSBAUER SPECTROMETERS
MONOCHROMATIC RADIATION
OXIDES
OXYGEN COMPOUNDS
PALLADIUM
PLATINUM METALS
RADIATIONS
SPECTROMETERS
SPUTTERING
SYNCHROTRON RADIATION
TIN COMPOUNDS
TIN OXIDES
TRANSITION ELEMENTS