Nuclear monochromator by grazing incidence anti-reflection films of {sup 119}SnO{sub 2}
Conference
·
OSTI ID:10178592
- City Coll., New York, NY (United States). Dept. of Physics
- Argonne National Lab., IL (United States)
A nuclear monochromator using grazing incidence anti-reflection (GIAR) films of {sup 119}SnO{sub 2} coated on a Pd backing mirror was designed, fabricated and characterized. {sup 119}SnO{sub 2} /Pd/quartz GIAR films were synthesized by a magnetron reactive sputtering technique. The films were characterized by x-ray scattering of 23.87 keV synchrotron radiation source. From the measurement of off-resonance reflectivity and the simulation of the resonant nuclear reflectivity, {approximately} 0.8 reflectivity with 10{sup {minus}2} electronic reflectivity and an energy band width {approximately} 100{Gamma} where {Gamma} is a natural line width, at a 2 mrad incident beam angle would be expected. The requirements and alternative methods to improve performance of a GIAR film nuclear monochromator were discussed.
- Research Organization:
- Argonne National Lab., IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 10178592
- Report Number(s):
- ANL/CP--76823; CONF-920708--2; ON: DE92040731
- Country of Publication:
- United States
- Language:
- English
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