Fabrication and characterization of SnO{sub 2} GIAR films
Journal Article
·
· Bulletin of the American Physical Society
OSTI ID:127769
- Brooklyn College-CUNY, Brooklyn, NY (United States)
- Argonne National Lab., IL. (United States); and others
The Grazing Incidence Anti Reflection (GIAR) films are used to suppress electronic reflectivity while maintaining good nuclear resonant reflectivity. The authors fabricated SnO{sub 2} GIAR films using magnetron sputtering on Pd coated quartz substrates to monochromatize synchrotron radiation down to {mu}eV levels at 23870 eV, {Delta}E/E{approximately}10{sup {minus}10}. Films are characterized by x-ray reflectivity and {sup 119}Sn Conversion Electron Mossbauer Spectroscopy. The film uniformity, interface and surface roughness and nuclear scattering will be discussed.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 127769
- Report Number(s):
- CONF-920376--
- Journal Information:
- Bulletin of the American Physical Society, Journal Name: Bulletin of the American Physical Society Journal Issue: 9 Vol. 37; ISSN BAPSA6; ISSN 0003-0503
- Country of Publication:
- United States
- Language:
- English
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