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Minority-carrier lifetime in ITO/InP heterojunctions

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.341743· OSTI ID:6998271
The relationship between photoluminescence lifetime and minority-carrier lifetime is derived for window/absorber heterojunctions by the method of Laplace transforms. The model includes the effects of diffusion to the depletion region and self-absorption of the emitted radiation. The model is applied to InP photoluminescence generated by pulsed laser excitation of indium-tin-oxide (ITO)/InP heterojunctions. The photoluminescence lifetime of a device with N/sub A/ = 1 x 10/sup 16/ cm/sup -3/ is about 21 ns. The bulk lifetime of the device can be fit with a lifetime of about 30 ns. The lifetime in the unprocessed substrate exceeds 200 ns indicating that recombination is induced by ITO processing.
Research Organization:
The Solar Energy Research Institute, Golden, Colorado 80401
OSTI ID:
6998271
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 64:4; ISSN JAPIA
Country of Publication:
United States
Language:
English