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Minority-carrier lifetime in InP as a function of light bias

Conference ·
OSTI ID:6468429
Minority-carrier lifetime in InP is studied as a function of doping level and laser intensity using time-resolved photoluminescence. A continuous wave diode laser illuminates bulk InP and acts as a light bias, injecting a steady-state concentration of carriers. A 200 ps laser pulse produces a small transient signal on top of the steady-state luminescence, allowing lifetime to be measured directly as a function of incident intensity. For p-InP, lifetime increases with light bias up to a maximum value. Bulk recombination centers are presumably filled to saturation, allowing minority carriers to live longer. The saturation bias scales with dopant concentration for a particular dopant species. As light bias is increased for n-InP, minority-carrier lifetime increases slightly but then decreases, suggesting radiative recombination as a dominant decay mechanism.
Research Organization:
National Aeronautics and Space Administration, Cleveland, OH (United States). Lewis Research Center
OSTI ID:
6468429
Report Number(s):
N-95-18453; NASA-TM--106821; E--9363; NAS--1.15:106821; CONF-941203--; CNN: RTOP 233-01-OA
Country of Publication:
United States
Language:
English

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