Comparison of performance of an analytical electron microscope at 300 and 100 kV

Journal Article · Tue Jan 01 04:00:00 EST 1985 · Mater. Res. Soc. Symp. Proc.; (United States)

OSTI ID:6957908

Bentley, J; Kenik, E A; Angelini, P; Fisher, A T; Sklad, P S; Lehman, G L; Horton, Jr, J A

Preliminary results on the performance of an analytical electron microscope (AEM) operating at 300 kV have been obtained and compared with the performance at 100 kV. Some features of the anticipated improvements for transmission electron microscopy (TEM) imaging, convergent beam electron diffraction (CBED), energy dispersive X-ray spectroscopy (EDS), and electron energy loss spectroscopy (EELS) have been studied from the aspect of materials science applications. The electron microscope used was a Philips EM430T operated with a LaB/sub 6/ cathode and equipped with EDAX 9100/90 EDS and Gatan 607 EELS systems. 12 references, 9 figures.

• Research Organization: Oak Ridge National Lab., TN
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 6957908
• Journal Information: Mater. Res. Soc. Symp. Proc.; (United States), Journal Name: Mater. Res. Soc. Symp. Proc.; (United States) Vol. 41; ISSN MRSPD
• Country of Publication: United States
• Language: English

Related Subjects

656002* -- Condensed Matter Physics-- General Techniques in Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COHERENT SCATTERING
DIFFRACTION
ELECTRON DIFFRACTION
ELECTRON MICROSCOPES
ELECTRON MICROSCOPY
MICROSCOPES
MICROSCOPY
PERFORMANCE
SCATTERING
SPECTROSCOPY
TRANSMISSION ELECTRON MICROSCOPY