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Materials science applications of a 120 kV FEG TEM/STEM: Triskaidekaphilia

Conference ·
OSTI ID:5844099
; ; ;
The introduction by several manufacturers of 200kV transmission electron microscopes (TEM) equipped with field emission guns affords the opportunity to assess their potential impact on materials science by examining applications of similar 100-120kV instruments that have been in use for more than a decade. This summary is based on results from a Philips EM400T/FEG configured as an analytical electron microscope (AEM) with a 6,585 scanning transmission (STEM) unit, EDAX 9100/70 or 9900 energy dispersive X-ray spectroscopy (EDS) systems, and Gatan 607 serial- or 666 parallel-detection electron energy-loss spectrometers (EELS). Examples in four areas that illustrate applications that are impossible or so difficult as to be impracticable with conventional thermionic electron guns are described.
Research Organization:
Oak Ridge National Lab., TN (USA)
Sponsoring Organization:
DOE; USDOE, Washington, DC (USA)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5844099
Report Number(s):
CONF-910870-7; ON: DE91010136
Country of Publication:
United States
Language:
English

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Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102 -- Chemical & Spectral Procedures
656002* -- Condensed Matter Physics-- General Techniques in Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALLOYS
CHEMICAL ANALYSIS
CRYSTAL LATTICES
CRYSTAL STRUCTURE
ELECTRON MICROSCOPES
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
EMISSION
ENERGY RANGE
ENERGY-LOSS SPECTROSCOPY
FIELD EMISSION
HIGH ALLOY STEELS
ION MICROSCOPY
IRON ALLOYS
IRON BASE ALLOYS
KEV RANGE
KEV RANGE 100-1000
MATERIALS
MICROSCOPES
MICROSCOPY
ORDER PARAMETERS
PHYSICAL RADIATION EFFECTS
QUANTITATIVE CHEMICAL ANALYSIS
RADIATION EFFECTS
SCANNING ELECTRON MICROSCOPY
SPECTROSCOPY
STAINLESS STEELS
STEELS
TRANSMISSION ELECTRON MICROSCOPY
USES
X-RAY SPECTROSCOPY