Microanalysis by electron energy loss spectroscopy at 300kV
Conference
·
OSTI ID:5755362
Some features of the anticipated improvements in microanalysis by electron energy loss spectroscopy (EELS) at 300 kV compared to opeation at 100kV have been studied with the use of a Philips EM430T equipped with Gatan 607 EELS and EDAX 9100/70 systems. Detailed measurements have been made on a range of specimens, with emphasis on boron nitride and silicon carbide.
- Research Organization:
- Oak Ridge National Lab., TN (USA)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 5755362
- Report Number(s):
- CONF-860854-2; ON: DE86009306
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
BORON COMPOUNDS
BORON NITRIDES
CARBIDES
CARBON COMPOUNDS
ELECTRON SPECTROSCOPY
ENERGY-LOSS SPECTROSCOPY
MICROANALYSIS
NITRIDES
NITROGEN COMPOUNDS
PNICTIDES
SILICON CARBIDES
SILICON COMPOUNDS
SPECTROSCOPY
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
BORON COMPOUNDS
BORON NITRIDES
CARBIDES
CARBON COMPOUNDS
ELECTRON SPECTROSCOPY
ENERGY-LOSS SPECTROSCOPY
MICROANALYSIS
NITRIDES
NITROGEN COMPOUNDS
PNICTIDES
SILICON CARBIDES
SILICON COMPOUNDS
SPECTROSCOPY