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Application of electron energy loss spectroscopy to microanalysis of irradiated stainless steels

Conference ·
OSTI ID:5845685
;  [1];  [2]
  1. Oak Ridge National Lab., TN (USA)
  2. Oak Ridge Associated Universities, Inc., TN (USA)
Energy dispersive X-ray spectroscopy (EDXS) has limited application to microanalysis of radioactive materials because of degraded detector performance and the intrinsic'' spectrum associated with the radioactive decay. Electron energy loss spectroscopy (EELS) is not affected by specimen radioactivity and also offers the possibility of improved spatial resolution. Measurements of radiation-induced segregation (RIS) in irradiated stainless steels have been made by both techniques. Analytical electron microscopy was performed at 100 kV in a Philips EM400T/FEG, equipped with an EDAX 9100/70 EDXS system and a Gatan 666 parallel detection EELS (PEELS). Microanalysis was performed in the STEM mode (<2-nm-diam probe with >0.5 nA) with the same acquisition time (50 s) used for both techniques.
Research Organization:
Oak Ridge National Lab., TN (USA)
Sponsoring Organization:
DOE; USDOE, Washington, DC (USA)
DOE Contract Number:
AC05-84OR21400; AC05-76OR00033
OSTI ID:
5845685
Report Number(s):
CONF-910870-2; ON: DE91009913
Country of Publication:
United States
Language:
English