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Suitability of non-hardened high density SRAMS for space applications. Technical report

Technical Report ·
OSTI ID:6955234
Several non-radiation-hardened high density static RAMs (SRAMs) were tested for susceptibility to single-event upset (SEU) and (latchup). Test results indicated that at present only a few such device types are suitable for use in space applications. Several additional factors such as susceptibility to multiple-bit upsets and to radiation-induced permanent damage need to be taken into consideration before these device types can be recommended. One non-hardened SRAM device type has recently been used on a low-Earth orbit satellite, enabling the upset rate measured in space to be compared to that predicted from ground-based testing. Single-event upset.
Research Organization:
Aerospace Corp., El Segundo, CA (United States). Engineering and Technology Group
OSTI ID:
6955234
Report Number(s):
AD-A-255898/9/XAB; TR--0091(6940-05)-3; CNN: F04701-88-C-0089
Country of Publication:
United States
Language:
English

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