Critical issues regarding SEU in avionics
- Boeing Aerospace, Seattle, WA (United States)
- Clemson Univ., SC (United States)
The energetic neutrons in the atmosphere cause microelectronics in avionic system to malfunction through a mechanism called single-event upsets (SEUs), and single-event latchup is a potential threat. Data from military and experimental flights as well as laboratory testing indicate that typical non-radiation-hardened 64K and 256K static random access memories (SRAMs) can experience a significant SEU rate at aircraft altitudes. Microelectronics in avionics systems have been demonstrated to be susceptible to SEU. Of all device types, RAMs are the most sensitive because they have the largest number of bits on a chip (e.g., an SRAM may have from 64K to 1M bits, a microprocessor 3K to 10K bits, and a logic device like an analog-to-digital converter, 12 bits). Avionics designers will need to take this susceptibility into account in current and future designs. A number of techniques are available for dealing with SEU: EDAC, redundancy, use of SEU-hard parts, reset and/or watchdog timer capability, etc. Specifications should be developed to guide avionics vendors in the analysis, prevention, and verification of neutron-induced SEU. Areas for additional research include better definition of the atmospheric neutrons and protons, development of better calculational models (e.g., those used for protons[sup 11]), and better characterization of neutron-induced latchup.
- OSTI ID:
- 5826489
- Report Number(s):
- CONF-930601--
- Journal Information:
- Transactions of the American Nuclear Society; (United States), Journal Name: Transactions of the American Nuclear Society; (United States) Vol. 68; ISSN 0003-018X; ISSN TANSAO
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
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42 ENGINEERING
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
AIRCRAFT COMPONENTS
COMPUTERS
COSMIC RADIATION
DAMAGING NEUTRON FLUENCE
DATA
DATA COMPILATION
DIGITAL COMPUTERS
ELECTRONIC CIRCUITS
FAILURES
FLIGHT TESTING
HARDENING
INFORMATION
IONIZING RADIATIONS
MICROCOMPUTERS
MICROELECTRONIC CIRCUITS
NEUTRON FLUENCE
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
RADIATIONS
TESTING