Depth dependence of alkali etching of poly(tetrafluoroethylene): Effect of x-ray radiation
- Sandia National Labs., Albuquerque, NM (USA)
Using Rutherford backscattering spectroscopy (RBS), the authors have shown that defluorination due to alkali etching of poly(tetrafluoroethylene) (PTFE or Teflon) extends to a depth of at least 3,000 {angstrom}. Equivalent alkali etching after irradiation with Mg K{alpha} X-rays gives no indication of defluorination within the depth resolution of RBS (150 {angstrom}); the RBS spectrum is identical with that of a reference PTFE sample. In contrast, X-ray photoelectron spectra (XPS) reveal comparable defluorination for both irradiated and nonirradiated samples. given the sampling depth of XPS and the depth resolution of RBS, this limits the defluorination depth of the irradiated surfaces of PTFE to between 30 and 150 {angstrom}.
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6952058
- Journal Information:
- Langmuir; (USA), Journal Name: Langmuir; (USA) Vol. 5:6; ISSN 0743-7463; ISSN LANGD
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360605* -- Materials-- Radiation Effects
38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY
400600 -- Radiation Chemistry
BACKSCATTERING
DATA
DATA ANALYSIS
ELECTRON SPECTROSCOPY
EQUIPMENT
ETCHING
EXPERIMENTAL DATA
FLUORINATED ALIPHATIC HYDROCARBONS
HALOGENATED ALIPHATIC HYDROCARBONS
INFORMATION
MATERIALS
MEASURING INSTRUMENTS
MEASURING METHODS
NUMERICAL DATA
ORGANIC COMPOUNDS
ORGANIC FLUORINE COMPOUNDS
ORGANIC HALOGEN COMPOUNDS
PETROCHEMICALS
PETROLEUM PRODUCTS
PHOTOELECTRON SPECTROSCOPY
PHYSICAL RADIATION EFFECTS
PLASTICS
POLY
POLYETHYLENES
POLYTETRAFLUOROETHYLENE
RADIATION EFFECTS
RADIATION SOURCES
SCATTERING
SPECTROSCOPY
SURFACE FINISHING
SYNTHETIC MATERIALS
TEFLON
X-RAY EQUIPMENT
X-RAY SOURCES