Ion beam analysis of the effects of radiation on the chemical etching of poly(tetrafluorethylene)
Rutherford backscattering (RBS) and elastic recoil detection (ERD) have been used to characterize the effects of x-ray irradiation on the alkali etching of poly(tetrafluorethylene) (PTFE/Teflon). Etching of an irradiated (20 min Mg(K/alpha/) x-rays) sample produces no RBS evidence of F surface loss (/approximately/150 /angstrom/ depth resolution) while x-ray photoelectron spectroscopy (XPS) measurements (/approximately/30 /angstrom/ sampling depth) show extensive F loss; thus the F loss in irradiated Teflon is limited to depths between 30--150 /angstrom/. In sharp contrast, etching of an unirradiated sample produces an RBS measured F loss to depths of 3000--4000 /angstrom/. Both the etching depth and the extent of defluorination are shown to be self limiting due to the build-up of reaction products in the pore structure resulting from the deep etching. ERD measurements show a similar H depth distribution, suggested to result from a water reaction during the dissolution of excess Na. An n-hexane rinse leaves a surface Na residue on x-ray irradiated material but sub-surface on unirradiated etched material. 6 refs., 6 figs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6050048
- Report Number(s):
- SAND-89-0857C; CONF-8906155-3; ON: DE89015889
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360601 -- Other Materials-- Preparation & Manufacture
360603 -- Materials-- Properties
360605* -- Materials-- Radiation Effects
ADHESION
ALKALI METAL COMPOUNDS
BACKSCATTERING
ETCHING
FLUORIDES
FLUORINATED ALIPHATIC HYDROCARBONS
FLUORINE COMPOUNDS
HALIDES
HALOGEN COMPOUNDS
HALOGENATED ALIPHATIC HYDROCARBONS
MATERIALS
MECHANICAL PROPERTIES
ORGANIC COMPOUNDS
ORGANIC FLUORINE COMPOUNDS
ORGANIC HALOGEN COMPOUNDS
PETROCHEMICALS
PETROLEUM PRODUCTS
PLASTICS
POLY
POLYETHYLENES
POLYTETRAFLUOROETHYLENE
RADIATION EFFECTS
SCATTERING
SODIUM COMPOUNDS
SODIUM FLUORIDES
SPECTRA
SURFACE FINISHING
SYNTHETIC MATERIALS
TEFLON
YIELD STRENGTH