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Nonradiative recombination in InGaAsP/InP light sources causing light emitting diode output saturation and strong laser-threshold-current temperature sensitivity

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.92317· OSTI ID:6874398
Nonradiative recombination with the rate strongly dependent on the injected carrier density n as ..cap alpha..n/sup 2en-dash4/ has been found to be the cause of the output saturation in 1.3-..mu..m InGaAsP/InP surface emitting double heterostructure light emitting diodes. It has been found that this nonradiative recombination is also responsible for the strong temperature sensitivity of InGaAsP/InP double heterostructure laser threshold current.
Research Organization:
Opto-Electronics Research Laboratories, Nippon Electric Co., Ltd. 4-1-1 Miyazaki, Takatsu-ku, Kawasaki 213, Japan
OSTI ID:
6874398
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 38:4; ISSN APPLA
Country of Publication:
United States
Language:
English