Microwave properties of highly oriented YBa sub 2 Cu sub 3 O sub 7 minus x thin films
- Physics Department, Rutgers University, Piscataway, New Jersey 08855 (USA)
- Bellcore, Red Bank, New Jersey 07701 (USA)
- TRW Space Technology Group, Redondo Beach, California 90278 (USA)
- Laboratory of Nuclear Studies, Newman Lab, Cornell University, Ithaca, New York 14853 (USA)
- David Sarnoff Research Center, Princeton, New Jersey 08543 (USA)
- Department of Physics, University of California, Los Angeles, California 90024 (USA) Solid State Science Center, University of California, Los Angeles, California 90024 (USA)
- Superconductor Technologies Inc., Santa Barbara, California 9311-2310 (USA)
- Department of Materials Science, Stanford University, Stanford, C
We have performed intra- and extra-cavity microwave frequency (1--100 GHz) measurements on high quality Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} superconducting thin films on (100) LaAlO{sub 3} substrates. The {similar to}0.3 {mu}m thin films fabricated by the pulsed laser deposition technique exhibit superconducting transition temperatures {gt}90 K, as determined by resistivity and ac susceptibility measurements, and critical current densities of 5{times}10{sup 6} A/cm{sup 2} at 77 K. Moreover, ion beam channeling minimum yields of {similar to}3% were measured, indicating the extremely high crystalline quality of films grown on the LaAlO{sub 3} substrate. Microwave surface resistance values at 77 K for these films are found to be more than one to two orders of magnitude lower than for copper at 77 K for almost the entire frequency range explored. We postulate that the reason we observe such low surface resistances in these films is the virtual absence of grain and phase boundaries coupled with the high degree of crystallinity. Furthermore, we believe that the residual resistance measured below {ital T}{sub {ital c}} is at present dominated by losses occurring in the substrate and the cavities rather than by losses intrinsic to the Y-Ba-Cu oxide superconductor.
- OSTI ID:
- 6861159
- Journal Information:
- Applied Physics Letters; (USA), Journal Name: Applied Physics Letters; (USA) Vol. 56:12; ISSN APPLA; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
656100 -- Condensed Matter Physics-- Superconductivity
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALINE EARTH METAL COMPOUNDS
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
BARIUM COMPOUNDS
BARIUM OXIDES
CHALCOGENIDES
CHANNELING
COPPER COMPOUNDS
COPPER OXIDES
CRITICAL CURRENT
CRYSTAL STRUCTURE
CURRENT DENSITY
CURRENTS
DATA
ELECTRIC CONDUCTIVITY
ELECTRIC CURRENTS
ELECTRICAL PROPERTIES
ELECTROMAGNETIC RADIATION
EXPERIMENTAL DATA
FILMS
INFORMATION
ION CHANNELING
LANTHANUM COMPOUNDS
LANTHANUM OXIDES
LOW TEMPERATURE
MICROWAVE RADIATION
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
RADIATIONS
RARE EARTH COMPOUNDS
SUPERCONDUCTING FILMS
SUPERCONDUCTIVITY
THERMODYNAMIC PROPERTIES
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
TRANSITION TEMPERATURE
YTTRIUM COMPOUNDS
YTTRIUM OXIDES