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Microwave surface resistance of YBa sub 2 Cu sub 3 O sub 7 thin films on LaAIO sub 3 substrates

Journal Article · · Journal of Applied Physics; (USA)
DOI:https://doi.org/10.1063/1.346493· OSTI ID:6429978
; ; ; ; ;  [1]; ;  [2]
  1. Los Alamos National Laboratory, Los Alamos, NM (USA)
  2. GE Research and Development Center, Schenectady, NY (USA)

The surface resistance {ital R}{sub {ital s}} of YBa{sub 2}Cu{sub 3}O{sub 7} (YBCO) thin films (0.6{plus minus}0.1 {mu}m) deposited onto 2.5-cm diam (100) LaAlO{sub 3} substrates has been measured at 22 GHz using both Cu and Nb cavities. The surface resistance falls precipitously at the superconducting transition ({Tc} =90 K) from a normal state value of approximately 2 {Omega} to a 77 K value of 13.7{plus minus}1 m{Omega}, which is 1.6 times lower than Cu. At 4 K the surface resistance is 1{plus minus}0.1 m{Omega}, as measured in a Nb superconducting cavity, which is an order of magnitude lower than Cu. The critical current density at 77 K is 4.5{times}10{sup 4} A/cm{sup 2}. Pole figure analyses show the ratio of {ital c}-axis to {ital a}-axis-oriented material in the film is 2.4:1. YBCO films deposited onto either LaGaO{sub 3} or LaAlO{sub 3} substrates with varying {ital c}/{ital a} ratios yield surface resistance values at 77 K that are crudely correlated with {ital R}{sub {ital s}}. Therefore, the principal effect of orienting the material is to improve the sharpness of the high-frequency superconducting transition, consistent with the notion that the sharpness is associated with {ital intergranular} rather than {ital intragranular} properties.

OSTI ID:
6429978
Journal Information:
Journal of Applied Physics; (USA), Journal Name: Journal of Applied Physics; (USA) Vol. 68:5; ISSN 0021-8979; ISSN JAPIA
Country of Publication:
United States
Language:
English