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U.S. Department of Energy
Office of Scientific and Technical Information

InGaAs PV device development for TPV power systems

Technical Report ·
OSTI ID:6827641
Indium gallium arsenide (InGaAs) photovoltaic devices have been fabricated with bandgaps ranging from 0.75 eV to 0.60 eV on Indium Phosphide (InP) substrates. Reported efficiencies have been as high as 11.2 percent (AMO) for the lattice matched 0.75 eV devices. The 0.75 eV cell demonstrated 14.8 percent efficiency under a 1500 K blackbody with a projected efficiency of 29.3 percent. The lattice mismatched devices (0.66 and 0.60 eV) demonstrated measured efficiencies of 8 percent and 6 percent respectively under similar conditions. Low long wavelength response and high dark currents are responsible for the poor performance of the mismatched devices. Temperature coefficients have been measured and are presented for all of the bandgaps tested.
Research Organization:
National Aeronautics and Space Administration, Cleveland, OH (United States). Lewis Research Center
OSTI ID:
6827641
Report Number(s):
N-95-11587; NASA-TM--106718; E--9084; NAS--1.15:106718; CNN: NAS3-27243; NAS3-27186; RTOP 233-01-0A
Country of Publication:
United States
Language:
English