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Evidence for Auger and free-carrier losses in GaInAsP/InP lasers: Spectroscopy of a short wavelength emission

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.93371· OSTI ID:6808872
We report the observation of two high-energy emission bands near 1.31 eV in Ga/sub 0.29/In/sub 0.71/As/sub 0.61/P/sub 0.39/ /InP laser diodes. One emission band is associated with recombination in the InP due to carrier leakage from the active layer. A second, more important emission band with an energy close to E/sub 0/+..delta../sub 0/ is associated with recombination of holes in the split-off valence band and electrons in the conduction band. The split-off valence band is significantly populated by Auger recombination and intervalence band absorption. From the dependence of the integrated E/sub 0/+..delta../sub 0/ luminescence intensity on injection current (below threshold) we determine an Auger coefficient for holes of Capprox. =5 x 10/sup -29/ cm/sup 6/ s/sup -1/ at T = 300 K.
Research Organization:
Universitaet Stuttgart, Physikalisches Institut 4, Pfaffenwaldring 57, D-7000 Stuttgart 80, Federal Republic of Germany
OSTI ID:
6808872
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 41:10; ISSN APPLA
Country of Publication:
United States
Language:
English