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Trace element measurements with synchrotron radiation

Conference ·
OSTI ID:6801023

Aspects of the application of synchrotron radiation to trace element determinations by x-ray fluorescence have been investigated using beams from the Cornell facility, CHESS. Fluoresced x rays were detected with a Si(Li) detector placed 4 cm from the target at 90/sup 0/ to the beam. Thick samples of NBS Standard Reference Materials were used to calibrate trace element sensitivity and estimate minimum detectable limits for this method.

Research Organization:
Brookhaven National Lab., Upton, NY (USA); State Univ. of New York, Geneseo (USA). Coll. of Arts and Sciences
DOE Contract Number:
AC02-76CH00016
OSTI ID:
6801023
Report Number(s):
BNL-32348; CONF-821123-31; ON: DE83005785
Country of Publication:
United States
Language:
English