Trace element measurements with synchrotron radiation

Journal Article · Thu Mar 31 23:00:00 EST 1983 · IEEE Trans. Nucl. Sci.; (United States)

DOI:https://doi.org/10.1109/TNS.1983.4332526· OSTI ID:5901316

Hanson, A L; Chen, J R; Gordon, B M; Jones, K W; Kraner, H W; Mills, R E

Aspects of the application of synchrotron radiation to trace element determinations by x-ray fluorescence have been investigated using beams from the Cornell facility, CHESS. Fluoresced x rays were detected with a Si(Li) detector placed 4 cm from the target at 90/sup 0/ to the beam. Thick samples of NBS Standard Reference Materials were used to calibrate trace element sensitivity and estimate minimum detectable limits for this method.

• Research Organization: Brookhaven National Lab, Upton, NY 11973
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5901316
• Journal Information: IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 30:2; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

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BREMSSTRAHLUNG
CHEMICAL ANALYSIS
ELECTROMAGNETIC RADIATION
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NONDESTRUCTIVE ANALYSIS
RADIATIONS
SYNCHROTRON RADIATION
TRACE AMOUNTS
USES
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS