Trace element measurements using white synchrotron radiation

Conference · Sun Nov 09 23:00:00 EST 1986

OSTI ID:6944957

Hanson, A L; Jones, K W; Gordon, B M; Pounds, J G; Kwiatek, W M; Long, G J; Rivers, M L; Sutton, S R

Synchrotron radiation, when used for x-ray fluorescence (XRF) has several advantages over conventional x-ray sources. Our group at Brookhaven National Laboratory is developing the equipment and expertise to make XRF measurements with synchrotron radiation. The apparatus is briefly described, along with the alignment techniques. Some minimum detectable limits for trace elements in thin biological standards measured with white light irradiations are presented.

• Research Organization: Brookhaven National Lab., Upton, NY (USA); Chicago Univ., IL (USA). Dept. of Geophysical Sciences
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 6944957
• Report Number(s): BNL-39105; CONF-861114-46; ON: DE87005244
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
430303* -- Particle Accelerators-- Experimental Facilities & Equipment
ACCELERATORS
ALIGNMENT
BIOLOGICAL MATERIALS
CHEMICAL ANALYSIS
CYCLIC ACCELERATORS
MATERIALS
NONDESTRUCTIVE ANALYSIS
NSLS
RADIATION SOURCES
SYNCHROTRON RADIATION SOURCES
SYNCHROTRONS
TRACE AMOUNTS
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS