Trace element determination using synchrotron radiation

Journal Article · Mon Mar 31 23:00:00 EST 1986 · Anal. Chem.; (United States)

DOI:https://doi.org/10.1021/ac00295a060· OSTI ID:6015014

Giauque, R D; Jaklevic, J M; Thompson, A C

The use of synchrotron radiation for high sensitivity trace multielement X-ray fluorescence determinations is demonstrated. Experimental conditions that yield optimum sensitivity are described. Emphasis was placed on establishing calibration techniques and procedures that would yield accurate results with high precision for elements present at concentration levels less that 1 ppm. Comparison of determined and listed elemental concentration values for five reference materials is given. By use of optimum conditions, minimum detectable limits of 20 ppb were ascertained for most elements. The results clearly illustrate the feasibility of performing high sensitivity trace element determinations for extremely small samples. 11 references, 7 figures, 2 tables.

• Research Organization: Lawrence Berkeley Lab., CA
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 6015014
• Journal Information: Anal. Chem.; (United States), Journal Name: Anal. Chem.; (United States) Vol. 58:4; ISSN ANCHA
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400104* -- Spectral Procedures-- (-1987)
ALKALI METALS
ALKALINE EARTH METALS
ARSENIC
BARIUM
BREMSSTRAHLUNG
BROMINE
CALCIUM
CHEMICAL ANALYSIS
CHROMIUM
COPPER
ELECTROMAGNETIC RADIATION
ELEMENTS
GALLIUM
HALOGENS
IRON
MANGANESE
MERCURY
METALS
NICKEL
NONDESTRUCTIVE ANALYSIS
NONMETALS
POTASSIUM
RADIATIONS
RUBIDIUM
SELENIUM
SEMIMETALS
STRONTIUM
SYNCHROTRON RADIATION
TITANIUM
TRACE AMOUNTS
TRANSITION ELEMENTS
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS
ZINC