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U.S. Department of Energy
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Development and fabrication of a solar cell junction processing system. Draft final report

Technical Report ·
DOI:https://doi.org/10.2172/6772311· OSTI ID:6772311
A program was undertaken to develop, construct and deliver to JPL a processing system capable of producing solar cell junctions by ion implantation followed by pulsed electron beam annealing. The machine was to be capable of processing 4-inch diameter single-crystal wafers at a rate of 10/sup 7/ wafers per year. A microcomputer-controlled pulsed electron beam annealer with a vacuum interlocked wafer transport system was designed, built and demonstrated to produce solar cell junctions on 4-inch wafers with an AMI efficiency of 12%. Experiments showed that a non-mass-analyzed (NMA) ion beam could implant 10 keV phosphorous dopant to form solar cell junctions which were equivalent to mass-analyzed implants. A NMA ion implanter, compatible with the pulsed electron beam annealer and wafer transport system was designed in detail but was not built because of program termination.
Research Organization:
Spire Corp., Bedford, MA (USA)
DOE Contract Number:
NAS-7-100-955640
OSTI ID:
6772311
Report Number(s):
DOE/JPL/955640-83; ON: DE84013469
Country of Publication:
United States
Language:
English