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Recombination lifetime of In[sub [ital x]]Ga[sub 1[minus][ital x]]As ternary alloys

Conference · · AIP Conference Proceedings (American Institute of Physics); (United States)
OSTI ID:6632009
; ; ; ;  [1]
  1. National Renewable Energy Laboratories, Golden Colorado (United States)
The recombination lifetime of In[sub [ital x]]Ga[sub 1[minus][ital x]]As ternary alloys was measured over a composition range of 0.53[lt][ital x][lt]0.74. The lattice matched ternary ([ital x]=0.53) was fabricated as a double heterostructure. Here InP layers provided both surface passivation and minority-carrier confinement. The non lattice-matched ternaries were grown on InP with an intermediate grading layer. Recombination in latticed-matched films was controlled by defects at low doping levels and radiative and/or Auger recombination at higher doping levels. Recombination in the mismatched films appeared to be dominated by dislocations at the highest indium concentrations.
OSTI ID:
6632009
Report Number(s):
CONF-940101--
Conference Information:
Journal Name: AIP Conference Proceedings (American Institute of Physics); (United States) Journal Volume: 321:1
Country of Publication:
United States
Language:
English