Improved charge collection of the buried p-i-n- a-Si:H radiation
Conference
·
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
OSTI ID:6608802
- Lawrence Berkeley Lab., CA (USA)
- Xerox Palo Alto Research Center, Palo Alto, CA (US)
Charge collection in hydrogenated amorphous silicon (a-Si:H) radiation detectors is improved for high LET particle detection by adding thin intrinsic layers to the usual p-i-n structure. This buried p-i-n structure enables us to apply higher bias and the electric field is enhanced. When irradiated by 5.8 MeV {alpha} particles, the 5.7 {mu}m thick buried p-i-n detector with bias 300 V gives a signal size of 60,000 electrons, compared to about 20,000 electrons with the simple p-i-n detectors. The improved charge collection in the new structure is discussed. The capability of tailoring the field profile by doping a-Si:H opens a way to some interesting device structures.
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 6608802
- Report Number(s):
- CONF-900143--
- Conference Information:
- Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) Journal Volume: 37:2
- Country of Publication:
- United States
- Language:
- English
Similar Records
Improved charge collection of the buried p-i-n a-Si:H radiation detectors
Field profile tailoring in a-Si:H radiation detectors
Applications of a-Si:H radiation detectors
Conference
·
Fri Sep 01 00:00:00 EDT 1989
·
OSTI ID:5484536
Field profile tailoring in a-Si:H radiation detectors
Conference
·
Wed Feb 28 23:00:00 EST 1990
·
OSTI ID:7069674
Applications of a-Si:H radiation detectors
Conference
·
Sat Jul 01 00:00:00 EDT 1989
·
OSTI ID:6041235
Related Subjects
42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
43 PARTICLE ACCELERATORS
430303 -- Particle Accelerators-- Experimental Facilities & Equipment
440104* -- Radiation Instrumentation-- High Energy Physics Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALPHA PARTICLES
AMORPHOUS STATE
CHARGE COLLECTION
CHARGED PARTICLE DETECTION
CHARGED PARTICLES
CHEMICAL REACTIONS
DETECTION
ELECTRIC FIELDS
ELECTRON DETECTION
ENERGY RANGE
ENERGY TRANSFER
HIGH ENERGY PHYSICS
HYDROGENATION
JUNCTIONS
LET
MEASURING INSTRUMENTS
MEV RANGE
MEV RANGE 01-10
P-N JUNCTIONS
PARTICLE TRACKS
PHYSICS
RADIATION DETECTION
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR JUNCTIONS
SI SEMICONDUCTOR DETECTORS
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
43 PARTICLE ACCELERATORS
430303 -- Particle Accelerators-- Experimental Facilities & Equipment
440104* -- Radiation Instrumentation-- High Energy Physics Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALPHA PARTICLES
AMORPHOUS STATE
CHARGE COLLECTION
CHARGED PARTICLE DETECTION
CHARGED PARTICLES
CHEMICAL REACTIONS
DETECTION
ELECTRIC FIELDS
ELECTRON DETECTION
ENERGY RANGE
ENERGY TRANSFER
HIGH ENERGY PHYSICS
HYDROGENATION
JUNCTIONS
LET
MEASURING INSTRUMENTS
MEV RANGE
MEV RANGE 01-10
P-N JUNCTIONS
PARTICLE TRACKS
PHYSICS
RADIATION DETECTION
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR JUNCTIONS
SI SEMICONDUCTOR DETECTORS