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Title: Photochemical vapor deposition of amorphous silicon photovoltaic devices: Annual subcontract report, 1 May 1985-30 April 1986

Technical Report ·
DOI:https://doi.org/10.2172/6587014· OSTI ID:6587014

Intrinsic, p-type, and n-type a-Si:H and p-type a-SiC:H thin-films have been deposited by Hg-sensitized photochemical vapor depositions (photo-CVD) from disilane. The photochemical reactor design includes two chambers separated by a movable uv-transparent Teflon curtain, which eliminates deposition on the reactor window. Photovoltaic devices of the type glass/TCO/p-i-n/metal were fabricated by photo-CVD. The device efficiency obtained at 87.5 mW/cm/sup 2/ and ELH illumination was 6.4%.

Research Organization:
Delaware Univ., Newark (USA). Inst. of Energy Conversion; Solar Energy Research Inst. (SERI), Golden, CO (United States)
DOE Contract Number:
AC02-83CH10093
OSTI ID:
6587014
Report Number(s):
SERI/STR-211-3114; ON: DE87001145
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products. Original copy available until stock is exhausted
Country of Publication:
United States
Language:
English