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Title: InGaAs-GaAs strained-layer quantum well buried heterostructure lasers (lambda>1. mu. m) by metalorganic chemical vapor deposition

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.100935· OSTI ID:6547890

Data are presented on long-wavelength (lambda>1 ..mu..m) strained-layer InGaAs-GaAs quantum well buried heterostructure lasers grown by a two-step metalorganic chemical vapor deposition (MOCVD) process. Wet chemical etched mesas with an active region width of 3.5 ..mu..m are formed in a step-graded InGaAs-GaAs quantum well structure using an oxide mask. Selective MOCVD regrowth is used to form the buried heterostructure. Data are presented for devices having output powers of greater than 130 mW/facet, pulsed threshold currents of less than 7 mA, and internal quantum efficiencies of greater than 60%, for an emission wavelength of 1.074 ..mu..m. The near-field patterns indicate stable index-guided fundamental mode operation to greater than 30I/sub th/.

Research Organization:
Compound Semiconductor Microelectronics Laboratory and Materials Research Laboratory, University of Illinois at Urbana-Champaign, 1406 West Green Street, Urbana, Illinois 61801
OSTI ID:
6547890
Journal Information:
Appl. Phys. Lett.; (United States), Vol. 54:6
Country of Publication:
United States
Language:
English