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Comparative evaluation of integrated injection logic

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6545705
 [1];
  1. Mission Research Corp., La Jolla, CA
+ Show Author Affiliations

Radiation effects on integrated injection logic arrays are presented in terms of available data on ''conventional'' structures and new test data on advanced structures. The advanced structures were developed for improved electrical performance, independent of radiation hardness. These results are used as a basis of reviewing the considerations in hardened I/sup 2/L development as an LSI technology in comparison to other contemporary LSI technologies.

OSTI ID:
6545705
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-24:6; ISSN IETNA
Country of Publication:
United States
Language:
English

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Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CONFIGURATION
ELECTRONIC CIRCUITS
HARDENING
INTEGRATED CIRCUITS
MICROELECTRONIC CIRCUITS
PERFORMANCE
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
SEMICONDUCTOR DEVICES