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Radiation effects on bitolar integrated injection logic

Conference · · IEEE Trans. Nucl. Sci., v. NS-22, no. 6, pp. 2605-2610
OSTI ID:4094718

Integrated Injection Logic (I$sup 2$L) is a new high-density, low power bipolar LSI technology that offers major performance advantages over other bipolar and MOS/LSI technologies. Results are presented on the experimentally- determined radiation susceptibility of developmental unhardened I$sup 2$L LSI logic cells in terms of neutron-induced displacement damage, ionizing-dose- induced surface effects and transient photoresponse. (auth)

Research Organization:
Northrop Research and Tech. Center, Hawthorne, CA
NSA Number:
NSA-33-020351
OSTI ID:
4094718
Journal Information:
IEEE Trans. Nucl. Sci., v. NS-22, no. 6, pp. 2605-2610, Journal Name: IEEE Trans. Nucl. Sci., v. NS-22, no. 6, pp. 2605-2610; ISSN IETNA
Country of Publication:
United States
Language:
English