Study of radiation effects in bulk CMOS microcircuits, I21/LSI logic cells and optical couplers. Final report jan-dec 74
Technical Report
·
OSTI ID:5046853
Results are presented on the study of radiation effects in bulk CMOS microcircuits, basic logic cells of developmental integrated-injection-logic (I2L) LSI, and optical couplers. Radiation effects considered include the permanent damage effects resulting from neutron displacement damage and total ionizing radiation dose. Transient photoresponse has been measured as a function of ionizing radiation pulse width. CMOS latch-up was investigated as induced by electrical pulsed overstress and/or pulsed ionizing radiation exposure. No significant synergistic effects were observed.
- Research Organization:
- Northrop Research and Technology Center, Hawthorne, CA (USA)
- OSTI ID:
- 5046853
- Report Number(s):
- AD-B-011702/8
- Country of Publication:
- United States
- Language:
- English
Similar Records
Integrated injection logic (I/sup 2/L). Comparative and design trade-off evaluation. Topical report May--December 1976
Radiation effects on bitolar integrated injection logic
Latch-up elimination in bulk CMOS LSI circuits
Technical Report
·
Mon Dec 06 23:00:00 EST 1976
·
OSTI ID:6482378
Radiation effects on bitolar integrated injection logic
Conference
·
Sun Nov 30 23:00:00 EST 1975
· IEEE Trans. Nucl. Sci., v. NS-22, no. 6, pp. 2605-2610
·
OSTI ID:4094718
Latch-up elimination in bulk CMOS LSI circuits
Conference
·
Mon Dec 31 23:00:00 EST 1979
·
OSTI ID:5268731
Related Subjects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DAMAGE
ELECTRONIC CIRCUITS
INTEGRATED CIRCUITS
LOGIC CIRCUITS
MICROELECTRONIC CIRCUITS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
SEMICONDUCTOR DEVICES
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DAMAGE
ELECTRONIC CIRCUITS
INTEGRATED CIRCUITS
LOGIC CIRCUITS
MICROELECTRONIC CIRCUITS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
SEMICONDUCTOR DEVICES