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U.S. Department of Energy
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Laser-chemical deposition and etching on the metallization level of integrated circuits

Conference ·
OSTI ID:6536051

Laser-controlled chemical deposition and etching techniques were used to modify integrated circuits. This work used a pulsed laser to initiate and control the etching, by chlorine gas, of aluminum conductors. New conducting paths were then formed by laser-chemical vapor deposition of highly-doped silicon from silane and diborane. Improved conductivity of laser-deposited connectors was achieved by the selective deposition of tungsten on the silicon. These techniques were used to ''rewire'' an integrated circuit allowing the full evaluation of the corrected circuit design.

Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6536051
Report Number(s):
SAND-86-1387C; CONF-861207-104; ON: DE87010035
Country of Publication:
United States
Language:
English