Single event upsets in gallium arsenide dynamic logic

Conference · Thu Dec 01 04:00:00 EST 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6488790

Fouts, D J ^[1]; Weatherford, T ^[2]; McMorrow, C; Melinger, J S; Campbell, A B ^[3]

---

1. Naval Postgraduate School, Monterey, CA (United States). ECE Dept.
2. SFA Inc., Landover, MD (United States)
3. Naval Research Lab., Washington, DC (United States)

The advantages and disadvantages of using gallium arsenide (GaAs) dynamic logic in computers and digital systems are briefly discussed, especially with respect to space applications. A short introduction to the topology and operation of GaAs Two-Phase Dynamic FET Logic (TDFL) circuits is presented. Experiments for testing the SEU sensitivity of GaAs TDFL, using a laser to create charge collection events, are described. Results are used to estimate the heavy-ion, soft error rate for TDFL in a spacecraft in geosynchronous orbit, and the dependence of the SEU sensitivity on clock frequency, clock voltage, and clock phase. Analysis of the data includes a comparison between the SEU sensitivities of TDFL and the more common static form of GaAs logic, Directly Coupled FET Logic (DCFL). This is the first reported SEU testing of GaAs dynamic logic.

• OSTI ID: 6488790
• Report Number(s): CONF-940726--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 41:6Pt1
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DATA
DATA ANALYSIS
ELECTRONIC CIRCUITS
EXPERIMENTAL DATA
INFORMATION
LOGIC CIRCUITS
NUMERICAL DATA
PERFORMANCE TESTING
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
SPACE FLIGHT
TESTING