Parameter-free, predictive modeling of single event upsets due to protons, neutrons, and pions in terrestrial cosmic rays

Conference · Thu Dec 01 04:00:00 EST 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6488708

Srinivasan, G R; Tang, H K; Murley, P C ^[1]

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1. IBM East Fishkill, Hopewell Junction, NY (United States). Semiconductor Research and Development Center

In this paper the authors present a new approach and a computer software for modeling single event upsets. This model, named Soft Error Montecarlo Model (SEMM), does not need any experimental inputs or any parameter fitting. It is intended to be a design tool for chip designers when they want to optimize their designs for soft error hardness and performance. The paper focuses on terrestrial cosmic rays that cause single event upsets. Details of the nuclear modeling and of the coupled device-circuit modeling are presented. Also presented are the comparison of SEMM predictions against measurements of single event upset rate in proton beam experiments and in computer main frame field tests performed at high ground elevations. They also present some proton-pion comparisons that are relevant to single event upsets.

• OSTI ID: 6488708
• Report Number(s): CONF-940726--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 41:6Pt1
• Country of Publication: United States
• Language: English

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46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPARATIVE EVALUATIONS
COMPUTER CODES
COSMIC RADIATION
ELECTRONIC CIRCUITS
EVALUATION
INTEGRATED CIRCUITS
IONIZING RADIATIONS
MATHEMATICAL MODELS
MICROELECTRONIC CIRCUITS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATIONS
S CODES
SPACE FLIGHT