Soft-error Monte Carlo modeling program, SEMM

Journal Article · Mon Jan 01 04:00:00 EST 1996 · IBM Journal of Research and Development

DOI:https://doi.org/10.1147/rd.401.0109· OSTI ID:248105

Murley, P C; Srinivasan, G R

The application of a computer program, SEMM (Soft-Error Monte Carlo Modeling), is described. SEMM calculates the soft-error rate (SER) of semiconductor chips due to ionizing radiation. Used primarily to determine whether chip designs meet SER specifications, the program requires detailed layout and process information and circuit Q{sub crit} values.

• Sponsoring Organization: USDOE
• OSTI ID: 248105
• Journal Information: IBM Journal of Research and Development, Journal Name: IBM Journal of Research and Development Journal Issue: 1 Vol. 40; ISSN 0018-8646; ISSN IBMJAE
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
99 GENERAL AND MISCELLANEOUS
CHARGE COLLECTION
FAILURES
INTEGRATED CIRCUITS
IONIZING RADIATIONS
PHYSICAL RADIATION EFFECTS
S CODES