The use of compositionally graded layers to minimize surface defects in In(AsSb) strained-layer superlattices
Conference
·
OSTI ID:6479724
Surface defects have been studied in InAs/sub x/Sb/sub 1-x//InSb strained-layer superlattices as a function of the profile of compositionally graded buffer layers. Comparisons were made between constant composition, step-graded and continuously graded buffer layers. The use of either constant composition layers or step-graded buffer layers resulted in an increase in surface defects for large lattice mismatch (x > 0.1). Surface defects were minimized by the use of continuously graded buffer layers for x = 0.2.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6479724
- Report Number(s):
- SAND-87-0404C; CONF-870761-1; ON: DE87010739
- Country of Publication:
- United States
- Language:
- English
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