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Crystallographic phase identification in the scanning electron microscope: Backscattered electron Kikuchi patterns

Conference ·
OSTI ID:6444325

Use of charge coupled device-based detector for acquisition of high-quality backscattered electron Kikuchi patterns (BEKP) allows on-line crystallographic phase identification in the SEM. Phase identification through combined BEKP and energy dispersive x-ray spectrometry is demonstrated using Ru oxide thin films on Si, which were identified as tetragonal RuO[sub 2]. (DLC)

Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
DOE; USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6444325
Report Number(s):
SAND-93-0813C; CONF-930822--2; ON: DE93011574
Country of Publication:
United States
Language:
English