Development of backscattered electron Kikuchi patterns for phase identification in the SEM

Conference · Fri Dec 01 04:00:00 EST 1995

OSTI ID:161517

Michael, J R; Goehner, R P

This paper describes the use of backscattered electron Kikuchi patterns (BEKP) for phase identification in the scanning electron microscope (SEM). The origin of BEKP is described followed by a discussion of detectors capable of recording high quality patterns. In this study a new detector based on charge coupled device technology is described. Identification of unknown phases is demonstrated on prepared and as received sample surfaces. Identification through a combination of energy dispersive x-ray spectrometry (EDS) and BEKP of a Laves phase in a weld in an alloy of Fe-Co-Ni-Cr-Nb and the identification of Pb{sub 2}Ru{sub 2}O{sub 6.5} crystals on PZT is demonstrated. Crystallographic phase analysis of micron sized phases in the SEM is a powerful new tool for materials characterization.

• Research Organization: Sandia National Labs., Albuquerque, NM (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 161517
• Report Number(s): SAND--95-2482C; CONF-9507160--3; ON: DE96002478
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CHARGE-COUPLED DEVICES
CHROMIUM ALLOYS
COBALT ALLOYS
DATA
ELECTRON MICROSCOPES
IRON ALLOYS
LAVES PHASES
LEAD OXIDES
MEASURING METHODS
NICKEL ALLOYS
NIOBIUM ALLOYS
PHASE STUDIES
PZT
RUTHENIUM OXIDES
SCANNING ELECTRON MICROSCOPY
WELDED JOINTS