Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns

Goehner, R. P.; Michael, J. R.

doi:10.6028/jres.101.031

Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns

Journal Article · Wed May 01 00:00:00 EDT 1996 · Journal of Research of the National Institute of Standards and Technology

DOI:https://doi.org/10.6028/jres.101.031· OSTI ID:1628732

Goehner, R. P. ^[1]; Michael, J. R. ^[2]

Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Materials and Process Sciences Center; DOE/OSTI
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Materials and Process Sciences Center

Backscattered electron Kikuchi patterns (BEKP) suitable for crystallographic phase analysis can be collected in the scanning electron microscope (SEM) with a newly developed charge coupled device (CCD) based detector. Crystallographic phase identification using BEKP in the SEM is unique in that it permits high magnification images and BEKPs to be collected from a bulk specimen. The combination of scanning electron microscope (SEM) imaging, BEKP, and energy dispersive x-ray spectrometry holds the promise of a powerful new tool for materials science.

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC04-94AL85000; NA0003525

OSTI ID:: 1628732

Journal Information:: Journal of Research of the National Institute of Standards and Technology, Journal Name: Journal of Research of the National Institute of Standards and Technology Journal Issue: 3 Vol. 101; ISSN 1044-677X

Publisher:: National Institute of Standards (NIST)Copyright Statement

Country of Publication:: United States

Language:: English

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Electron backscatter diffraction beyond the mainstream: Electron backscatter diffraction beyond the mainstream Nolze, Gert; Hielscher, Ralf; Winkelmann, Aimo Crystal Research and Technology, Vol. 52, Issue 1 https://doi.org/10.1002/crat.201600252	journal	October 2016
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The effects of crystallography on grain-boundary migration in alumina Farrer, Jeffrey K.; Carter, C. Barry; Ravishankar, N. Journal of Materials Science, Vol. 41, Issue 3 https://doi.org/10.1007/s10853-006-6482-2	journal	February 2006
Solidification of Nb-bearing superalloys: Part I. Reaction sequences DuPont, J. N.; Notis, M. R.; Marder, A. R. Metallurgical and Materials Transactions A, Vol. 29, Issue 11 https://doi.org/10.1007/s11661-998-0319-3	journal	November 1998
Blind lattice-parameter determination of cubic and tetragonal phases with high accuracy using a single EBSD pattern Han, Ming; Chen, Chen; Zhao, Guangming Acta Crystallographica Section A Foundations and Advances, Vol. 74, Issue 6 https://doi.org/10.1107/s2053273318010963	journal	October 2018
Crystal symmetry determination in electron diffraction using machine learning Kaufmann, Kevin; Zhu, Chaoyi; Rosengarten, Alexander S. Science, Vol. 367, Issue 6477 https://doi.org/10.1126/science.aay3062	journal	January 2020
Distribution of local deformations in diamond crystals according to the analysis of Kikuchi lines profile intensities Borcha, M. D.; Balovsyak, S. V.; Fodchuk, I. M. Journal of Superhard Materials, Vol. 35, Issue 4 https://doi.org/10.3103/s1063457613040035	journal	July 2013

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47 OTHER INSTRUMENTATION
71 CLASSICAL AND QUANTUM MECHANICS
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