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Mobility-lifetime products in CuGaSe/sub 2/

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.101487· OSTI ID:6418124

We report the first accurate determination of mobility-lifetime products, ..mu..tau, in thin films of a Cu-ternary chalcopyrite by photoconductivity and ambipolar diffusion length measurements. We found that for Cu-deficient, nearly intrinsic CuGaSe/sub 2/ at an illumination of about 0.25 AM1 the hole's ..mu..tau is 6 x 10/sup -6/ cm/sup 2//V while the electron's ..mu..tau is 2.6 x 10/sup -9/ cm/sup 2//V. The lifetime dependence on the light intensity was found to be characterized by the exponent ..gamma..-1 = -0.44.

Research Organization:
The Racah Institute of Physics, The Hebrew University, Jerusalem 91904, Israel
OSTI ID:
6418124
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 54:13; ISSN APPLA
Country of Publication:
United States
Language:
English