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U.S. Department of Energy
Office of Scientific and Technical Information

High-quality silicon films prepared by zone-melting recrystallization

Technical Report ·
OSTI ID:6407586
The graphite strip heater zone melting recrystallization (ZMR) technique is described. The material properties of the ZMR films, and SOI device results are reviewed. Although our ZMR work is primarily motivated by integrated circuit applications, this work evolved in part from earlier research on laser crystallization of thick amorphous GaAs and Si films, which was undertaken with the goal of producing low cost photovoltaic materials. The ZMR growth process and its effect on the properties of the recrystallized films may contribute some insight to a general understanding of the rapid recrystallization of Si for solar cells. Adaptation of ZMR for solar cell fabrication is considered.
Research Organization:
Massachusetts Inst. of Tech., Lexington (USA). Lincoln Lab.
OSTI ID:
6407586
Report Number(s):
N-84-28638
Country of Publication:
United States
Language:
English