skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Zone-melting recrystallization for solar cells. Final report, September 1, 1982-August 31, 1984

Technical Report ·
OSTI ID:6226513

Zone-melting recrystallization (ZMR) of Si on SiO/sub 2/ has been investigated to determine if the process can be adapted to produce material configurations suitable for low-cost, high-efficiency photovoltaic cells. In addition, we have demonstrated ZMR of InSb, and begun to establish a practical process for Ge ZMR, with the objective of growing GaAs epitaxially on the Ge. Fundamental recrystallization mechanisms, crystallographic characteristics and electrical properties have been studied. Novel means of controlling crystallographic properties have been developed, including: hourglass, vertical-constriction, entrainment, and orientation-filtering techniques. EBIC studies indicated enhanced dopant diffusion along grain boundaries and subboundaries, and showed that the diffusion length of minority carriers is approx. 100..mu..m. DLTS studies showed that ZMR films do not contain deep levels associated with impurities, and have interface-state densities comparable to IC-grade Si wafers. A (100) crystallographic texture can be achieved in 50..mu..m-thick ZMR Si films using the vertical-constriction technique. Such films can provide a double pass of incident light and should be suitable for high-efficiency photovoltaic cells. Both two-sided and back-contact cells have been fabricated which showed good blue response and modest efficiency. The ZMR process should enable one to produce thick single-crystal Si films directly on the windows of photovoltaic modules. This should lead to practical, low-cost, high-efficiency single crystal cells.

Research Organization:
Massachusetts Inst. of Tech., Cambridge (USA)
DOE Contract Number:
AC02-82ER13019
OSTI ID:
6226513
Report Number(s):
DOE/ER/13019-2; ON: DE85004783
Resource Relation:
Other Information: Portions are illegible in microfiche products
Country of Publication:
United States
Language:
English